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IOTAMETRIX

D non-destructive optical characterization of materials with nanometric resolution

IotaMetrix develops non-destructive optical metrology solutions for surface and volume characterization at the nanometric scale. Our technology enables 3D quantitative imaging with sub-100 nm resolution, without any sample preparation, providing both time efficiency and precision for quality control. Our instruments are designed for industrial players working with advanced materials, who aim to improve their manufacturing processes and ensure the reliability of their products

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