We make the best of high-performance instruments to characterize materials at nano and micro-scales in 2D and 3D. Our techniques encompass electron microscopy (TEM & SEM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS), Electron Probe Microanalysis (EPMA), Glow Discharge Optical Emission Spectroscopy (GD-OES) and X-ray microtomography. We also master various tools for specific specimen preparations. Our organization is customer-oriented and offer top-quality services and expertise to academics and industry.
